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  AFM submicron calibration (278nm)

Calibration grating for SPM and STM submicron calibration in X or Y direction.

Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
Diffraction grating TDG01_Au is intended for submicron calibration scanning tunneling microscopes (STM) in the X or Y direction.

 

 
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