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  CSG30
High Resolution CONTACT GOLDEN Silicon Cantilevers CSG30 series. Due to the medium meanings of force constant and resonant frequency the probes can be used in contact, semicontact and noncontact modes.
Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove.
CSG30/15 (15 separated chips), 300,00 €
CSG30/50 (50 separated chips), 850,00 €

PROBES GENERAL INFORMATION

CSG30 series specification

Material

Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped

Chip size

3.4x1.6x0.3mm

Reflective side

Au

Cantilever number

1 rectangular

Tip curvature radius

typical 6nm, guaranteed 10nm

Also available coatings

conductive PtIr

Available CSG30 probe 

bare, tipless, with Al reflective coating

 

 

   

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

CSG30

190

30

1.5

26

48

76

0.13

0.6

2

 
 
 
 
 
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