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TOP VISUAL NONCONTACT Silicon Cantilevers VIT_P_C-A series
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VIT_P_C-A/50 (50 separated chips), 1190,00 €
VIT_P_C-A/15 (15 separated chips), 405,00 €
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TOP VISUAL probes intended:
1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end - for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).
Image in optical microscope
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VIT_P_C-A series specification |
Material |
Si |
Chip size |
3.4x1.6x0.3mm |
Reflective side coating |
Al |
Front coating |
None |
Cantilever number |
1 rectangular |
Tip curvature radius |
typical 6nm, guaranteed 10nm |
Tip shape |
Pyramidal |
Tip height |
14-16 um |
Cantilever series |
Cantilever length, L±20µm |
Cantilever width, W±1µm |
Cantilever thickness, T±1 µm |
Resonant frequency, kHz |
Force constant, N/m |
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min |
typical |
max |
min |
typical |
max |
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VIT_P_C-A |
450 |
50 |
2.5 |
8 |
16 |
25 |
0.3 |
0.6 |
1 |
