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  MFM_LM

Low Moment High resolution magnetic probes MFM_LM series

MFM_LM/15 (15 separated chips), 560,00 €
MFM_LM/50 (50 separated chips), 1590,00 €

Low Moment High Resolution Magnetic tips MFM_LM possess 15nm* CoCr coating, which is two times thinner compare to standard MFM tips. Decreasing the magnetic moment of MFM tip is important in case of imaging low coercitive magnetic samples, such as iron garnet films with coercitivity of about 20 Oe.

Low moment MFM tips with reduced magnetic stray fields significantly reduce magnetization reversal during imaging and improve quality of the MFM results.

MFM_LM series specification

Material

Highly doped Si

Chip size

3.4x1.6x0.3mm

Reflective side coating

Al

Tip side coating

CoCr magnetic coating with additional layers protecting from oxidation

Cantilever number

1 rectangular

Tip curvature radius

typical 25-30nm

Coating thickness

15-20 nm

Guaranteed cantilever lifetime is 1 year if it’s storaged at the normal conditions (humidity 30-40%).

 
Cantilever series
Cantilever length, L±10 µm
Cantilever width, W±5 µm
Cantilever thickness,
T±0.5 µm
Resonant frequency, kHz
Force constant, N/m
min
typical
max
min
typical
max
MFM_LM
225
32
2.5
47
70
90
1
3
5

 *At customer request we can make probes with different coating thickness to achieve different magnetic moments which will be the best for measuring of your samples.

 
 
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