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  NSG01/TiN
High Resolution NONCONTACT GOLDEN Silicon Cantilevers NSG01 series with TiN conductive coating
NSG01/TiN/15 (15 separated chips)
NSG01/TiN/50 (50 separated chips)

PROBES GENERAL INFORMATION

NSG01/TiN series specification

Material

Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped

Chip size

3.4x1.6x0.3mm

Reflective side

Au

Conductive coating

TiN (25nm)

Cantilever number

1 rectangular

Tip curvature radius

~ 35nm

Also available coatings

conductive Au, PtIr;

magnetic CoCr

Available NSG01 probe 

bare, tipless, with Al reflective coating

 

 

   

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

NSG01

125

30

2.0

87

150

230

1.45

5.1

15.1

 
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